News | October 23, 2007

New NIR Process Probes From FOSS NIRSystems, Inc.

FOSS NIRSystems is constantly developing optimized and practical sampling devices and interfaces for NIR applications. Two new probes that have been recently introduced are:

  • The FOSS NIRSystems Optimized Powder Analysis Probe Specially designed for measuring powders during semi-turbulent flow drying processes.
  • The FOSS NIRSystems Optimized Purge Probe
    With collecting "spoon" specially design for measuring powders during drying processes.

FOSS patented in-line and on-line process analyzers will minimize start-up time, determine exact chemical endpoints and optimize product consistency. Our rugged systems track critical quality parameters for bulk chemical, drying, mixing operations and biological processes.

FOSS XDS Process Analytics offers up to 9 sampling points per analyzer. The analyzers are standard NEMA 4X/IP65 rated and can be upgraded to meet most electrical classifications (C1D1, C1DII, ATEX, etc.).

SOURCE: FOSS NIRSystems, Inc.